TY - CONF A1 - Heidt, Heinrich A1 - Goebbels, Jürgen A1 - Reimers, Peter A1 - Kettschau, A. ED - Aman, J. K. T1 - Development and application of an universal CAT-scanner T2 - Proceedings of the 11th World Conference on Nondestructive Testing T2 - 11th World Conference on Nondestructive Testing CY - Las Vegas, NV, USA DA - 1985-11-03 PY - 1985 SN - 0-931403-07-3 SP - 664 EP - 671 PB - Taylor Publ. CY - Dallas, Tex AN - OPUS4-34219 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER -