TY - JOUR A1 - Bartscher, M. A1 - Neukamm, M. A1 - Hilpert, U. A1 - Neuschaefer-Rube, U. A1 - Härtig, F. A1 - Kniel, K. A1 - Ehrig, Karsten A1 - Staude, Andreas A1 - Goebbels, Jürgen T1 - Achieving traceability of industrial computed tomography JF - Key engineering materials KW - Industrial computed tomography (CT) KW - Coordinate metrology KW - Traceability PY - 2010 DO - https://doi.org/10.4028/www.scientific.net/KEM.437.79 SN - 1013-9826 VL - 437 SP - 79 EP - 83 PB - Trans Tech Publ. CY - Aedermannsdorf AN - OPUS4-20985 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER -