TY - JOUR A1 - Reiche, I. A1 - Berger, Achim A1 - Görner, Wolf A1 - Merchel, Silke A1 - Radtke, Martin A1 - Riederer, J. A1 - Riesemeier, Heinrich A1 - Roth, M. T1 - Following the traces of Albrecht Dürer: analysis of silverpoint drawings by spatially resolved synchrotron-induced X-ray fluorescence analysis JF - Nuclear instruments and methods in physics research B N2 - Spatially resolved X-ray fluorescence analysis using synchrotron radiation (SR-XRF) at the wavelength shifter beamline, BAMline, at BESSY was used to investigate Renaissance silverpoint drawings as it is extremely sensitive, non-destructive and can be carried out in air using an excitation spot in the hundred micrometer range. This paper deals with first results of the study of silverpoint drawings of Albrecht Dürer (1471–1528) belonging to the sketchbook that Albrecht Dürer used during a travel to the Netherlands in 1520/21. These results are compared to a PIXE study performed on drawings from the same sketchbook. The minor element composition of the silverpoint used for the drawings in the sketchbook was (10.6 ± 3.5) wt.% of Cu and traces of Zn. Mercury was found in the marks but does not belong to the initial composition of the silverpoint as it is attributed to an alteration phenomenon. One drawing of the sketchbook represents an exception. It consists of silver marks containing an additional minor element, Zn, in the marks and was, therefore, created with another silverpoint, probably at a different time than the other drawings. KW - Synchrotron KW - SR-XRF analysis KW - Drawing KW - Silverpoint KW - Albrecht Dürer PY - 2004 DO - https://doi.org/10.1016/j.nimb.2004.03.081 SN - 0168-583X SN - 1872-9584 VL - 226 IS - 1-2 SP - 83 EP - 91 PB - Elsevier CY - Amsterdam AN - OPUS4-4574 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER -