TY - CONF A1 - Dietrich, Paul A1 - Gross, Thomas A1 - Horlacher, T. A1 - Girard-Lauriault, Pierre-Luc A1 - Lippitz, Andreas A1 - Min, Hyegeun A1 - Wirth, Thomas A1 - Castelli, R. A1 - Seeberger, P.H. A1 - Unger, Wolfgang T1 - Surface analytical investigations (XPS, NEXAFS and ToF-SIMS) of carbohydrate-functionalized surfaces T2 - SIMS XVIII, 18th International Conference on Secondary Ion Mass Spectrometry T2 - SIMS XVIII, 18th International Conference on Secondary Ion Mass Spectrometry CY - Trento, Italy DA - 2011-09-18 PY - 2011 AN - OPUS4-24445 LA - deu AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER -