TY - CONF A1 - Hodoroaba, Vasile-Dan A1 - Rades, Steffi A1 - Ortel, Erik A1 - Mielke, Johannes A1 - Salge, T. A1 - Schmidt, R. T1 - Characterization of nanoparticles by means of high-resolution SEM/EDS T2 - EMAS 2015 - 14th European Workshop on Modern Developments and applications in microbeam analysis T2 - EMAS 2015 - 14th European Workshop on Modern Developments and applications in microbeam analysis CY - Portoroz, Slovenia DA - 2015-05-03 PY - 2015 AN - OPUS4-33250 LA - deu AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER -