TY - CONF A1 - Hodoroaba, Vasile-Dan A1 - Wirth, Thomas A1 - Terborg, R. A1 - Kim, K. Y. A1 - Unger, Wolfgang T1 - Measurement of atomic fractions in Cu(In, Ga)Se2 films by Auger Electron Spectroscopy (AES) und Energy Dispersive Electron Probe Microanalysis (ED-EPMA) T2 - Microscopy and Microanalysis M&M 2014 T2 - Microscopy and Microanalysis M&M 2014 CY - Hartford, CT, USA DA - 2014-08-02 PY - 2014 AN - OPUS4-31467 LA - deu AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER -