TY - CONF A1 - Hodoroaba, Vasile-Dan A1 - Procop, Mathias T1 - Micro-X-Ray fluorescence as an extension of the analytical scanning electron microscope T2 - The 56th Annual Denver X-Ray Conference (DXC 2007) T2 - The 56th Annual Denver X-Ray Conference (DXC 2007) CY - Denver, CO, USA DA - 2007-07-30 PY - 2007 AN - OPUS4-15187 LA - deu AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER -