TY - CONF A1 - Hodoroaba, Vasile-Dan A1 - Procop, Mathias T1 - Performance Check of a Wavelength Dispersive X-Ray Spectrometer (WDS) attached to a SEM T2 - Microscopy & Microanalysis T2 - Microscopy & Microanalysis CY - Richmond, VA, USA DA - 2009-07-26 PY - 2009 AN - OPUS4-19442 LA - deu AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER -