TY - CONF A1 - Hodoroaba, Vasile-Dan A1 - Lippitz, Andreas A1 - Kraft, Benedikt A1 - Rackwitz, Vanessa A1 - Terborg, R. T1 - Performance Check of EDS X-Ray Spectrometers - Extension to high Count Rates T2 - Microscopy & Microanalysis 2011 Meeting T2 - Microscopy & Microanalysis 2011 Meeting CY - Nashville, TN, USA DA - 2011-08-07 PY - 2011 AN - OPUS4-24132 LA - deu AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER -