TY - CONF A1 - Kunz, Valentin A1 - Kjaervik, Marit A1 - Müller, Anja A1 - Hodoroaba, Vasile-Dan A1 - Unger, Wolfgang T1 - How to meet new challenges in advanced nanoparticle analytics N2 - Three current research projects performed at BAM’s Division for Surface Analysis and Interfacial Chemistry are presented that tackle important challenges with regard to the characterization of nanomaterials: 1) The characterization at ambient pressure, 2) the investigation of core-shell nanoparticles, and 3) the characterization of non-spherical particles by electron microscopy. 1) Surface analytical techniques such as Photoelectron Spectroscopy (XPS) or Secondary Ion Mass Spectrometry (SIMS) typically require measurements in ultra-high vacuum. However, for many applications (e.g. catalysis and nanotoxicology) it is important to know the surface chemical properties of nanomaterials at ambient conditions. Therefore, near-ambient pressure X-ray photoelectron spectroscopy (NAP-XPS) was used to investigate nanoparticles in suspension. The used instrumental set-up allows to directly insert nanoparticle suspensions into the analysis chamber and to measure without prior sample preparation. Compared to dry reference samples measured under high-vacuum, a shift towards higher binding energies was observed for silver nanoparticles in water, indicating a change of surface potential at the water-nanoparticle interface. 2) To determine the dimensions of core-shell nanoparticles (shell thickness, core and total diameter), scanning transmission X-ray microscopy (STXM) was used. The analyzed model system consists of a polytetrafluorethylene (PTFE) core surrounded by a polystyrene (PS) shell, providing a strong X-ray absorption contrast at the C K-edge and a well-defined interface. The introduced STXM‐based methodology yields particle dimensions in agreement with scanning electron microscopy (SEM) results and provides additional information such as the position of the particle core, which cannot be extracted from a SEM micrograph. 3) The accurate measurement of size distributions of non-spherically shaped nanoparticles (representing most of the industrial nanoparticulate materials) is a challenging analytical task. High-resolution electron microscopy (TEM and SEM) is best suited to access the shape of individual nanoparticles. To fill the gap between ideal, monodisperse particles of spherical shape and complex real-world samples, BAM has started the work to develop reference nanoparticles of controlled shape, such as TiO2 platelets, bipyramids, and elongated particles. Results of a recent ISO inter-laboratory comparison will be shown with emphasis on the measurement parameters, descriptors and data analysis. T2 - NanoSafe Conference 2018 CY - Grenoble, France DA - 5.11.2018 KW - Nanoparticles PY - 2018 AN - OPUS4-46730 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER -