TY - GEN A1 - Altenburg, Simon T1 - Process monitoring in LBM using thermography and optical tomography N2 - Additive manufacturing (AM) opens the route to a range of novel applications. However, the complexity of the manufacturing process poses a challenge to produce defect-free parts with a high reliability. Since process dynamics and resulting microstructures of AM parts are strongly influenced by the involved temperature fields and cooling rates, thermography is a valuable tool for process monitoring. Another approach to monitor the energy input into the part during process is the use of optical tomography. Common visual camera systems reach much higher spatial resolution than infrared thermography cameras, whereas infrared thermography provides a much higher temperature dynamic. Therefore, the combined application increases the depth of information. Here, we present first measurement results using a laser beam melting setup that allows simultaneous acquisition of thermography and optical tomography from the same point of view using a beam splitter. A high-resolution CMOS camera operating in the visible spectral range is equipped with a near infrared bandpass filter and images of the build plate are recorded with long-term exposure during the whole layer exposing time. Thus, areas that reach higher maximum temperature or are at elevated temperature for an extended period of time appear brighter in the images. The used thermography camera is sensitive to the mid wavelength infrared range and records thermal videos of each layer exposure at an acquisition rate close to 1 kHz. As a next step, we will use computer tomographic data of the built part as a reference for defect detection. This research was funded by BAM within the focus area Materials. T2 - 3rd International Symposium Additive Manufacturing (ISAM 2019) CY - Dresden, Germany DA - 30.01.2019 KW - Additive manufacturing KW - Laser beam melting KW - Thermography KW - Optical Tomography PY - 2019 UR - https://opus4.kobv.de/opus4-bam/frontdoor/index/index/docId/47299 AN - OPUS4-47299 AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany