TY - JOUR A1 - Chemello, Giovanni A1 - Radnik, Jörg A1 - Hodoroaba, Vasile-Dan T1 - Analysis of Industrial Graphene-Based Flakes – First Results on Morphological Characterization, Sample Preparation and Chemical Composition JF - Microscopy and Microanalysis N2 - In order to bridge the gap between lab-scale and industrial-scale production of graphene it is necessary to develop processes, equipment and measurement procedures to control the material features. One of the crucial reasons of graphene’s limited commercialization is the lack of standard procedures to properly characterize and define the material chemical and structural properties down to the nanometer level. This leads to many issues regarding material synthesis repeatability, inappropriateness choice of measurands and measurement reproducibility which heavily affect the consistency of the material performance. In our study, a comparative analysis is performed on two different series (G5 and G6) of industrial graphene powders, each series produced with four types of functionalization: raw graphene, oxygen-functionalized, nitrogen-functionalized and fluorine-functionalized. All the 8 sample variants were analyzed from a chemical and morphological point of view in the form of powders prepared as slightly pressed in metallic sample holders. The results of the comparative chemical analyses XPS and EDS show a good agreement in the concentration values for all the elements present in the samples, despite the different analysis volumes addressed by the two techniques. For this reason, the samples can be considered homogeneous in both lateral and vertical direction. A clear influence of the morphology on the composition is evident. Therefore, such correlative measurements of morphology and composition are necessary for a comprehensive characterization of industrial graphene flakes. KW - Graphene powder KW - XPS KW - HAXPES KW - SEM KW - EDS KW - Functionalized graphene PY - 2022 DO - https://doi.org/10.1017/S1431927622004342 SN - 1435-8115 VL - 28 IS - Suppl 1 SP - 1006 EP - 1008 PB - Cambridge University Press CY - New York, NY AN - OPUS4-55512 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER -