TY - JOUR A1 - Rühle, Bastian A1 - Hodoroaba, Vasile-Dan T1 - Towards Automated Electron Microscopy Image Segmentation for Nanoparticles of Complex Shape by Convolutional Neural Networks JF - Microscopy and Microanalysis N2 - In this contribution different ways are explored with the aim to generate suitable training data for ‘non-ideal’ samples using various approaches, e.g., computer-generated images or unsupervised learning algorithms such as generative adversarial networks (GANs). We used these data to train simple CNNs to produce segmentation masks of SEM images and tested the trained networks on real SEM images of complex nanoparticle samples. The novel use of CNN for the automated analysis of the size of nanoparticles of complex shape and with a high degree of agglomeration has proved to be a promising tool for the evaluation of particle size distribution on a large number of constituent particles. Further development and validation of the preliminary model, respectively larger training and validation data sets are necessary. KW - Nanoparticles KW - Convolutional neural networks KW - Image segmentation KW - Electron microscopy KW - Automatisation PY - 2020 DO - https://doi.org/10.1017/S1431927620017262 VL - 26 IS - S2 SP - 1188 EP - 1189 PB - Cambridge University Press CY - Cambridge, UK AN - OPUS4-51773 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER -