TY - CONF A1 - Unger, Wolfgang T1 - 1. Metrological Directions in Surface and Micro/Nano Analysis in BAM 2. OH group density at polymer surfaces T2 - CCQM Surface Analysis Working Group Meeting for 2004 T2 - CCQM Surface Analysis Working Group Meeting for 2004 CY - Sèvres, France DA - 2004-04-20 PY - 2004 AN - OPUS4-4608 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER -