TY - CONF A1 - Unger, Wolfgang T1 - Surface & thin film analysis at BAM: Development of certified reference materials and surface characterisation of plasma polymerized thin films T2 - Seminar im Lab. of Physical-Chemistry of Surfaces (CNRS-ENSCP), Ecole Nationale Superieure de Chemie de Paris T2 - Seminar im Lab. of Physical-Chemistry of Surfaces (CNRS-ENSCP), Ecole Nationale Superieure de Chemie de Paris CY - Paris, France DA - 2006-04-04 PY - 2006 AN - OPUS4-12286 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER -