TY - CONF A1 - Hodoroaba, Vasile-Dan A1 - Unger, Wolfgang A1 - Jenett, H. A1 - Hoffmann, V. A1 - Hagenhoff, B. A1 - Kayser, S. A1 - Wetzig, K. T1 - Depth profiling of electrically non-conductive layered samples by RF-GDOES, HFM plasma SNMS and ToF-SIMS T2 - AOFA 11 (Angewandte Oberflächenanalytik) T2 - AOFA 11 (Angewandte Oberflächenanalytik) CY - Leipzig, Germany DA - 2000-09-24 PY - 2000 SP - 1 Seite AN - OPUS4-982 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER -