TY - CONF A1 - Zscherpel, Uwe A1 - Osterloh, Kurt A1 - Ewert, Uwe T1 - Unsharpness Characteristics of digital detectors for industrial radiographic imaging T2 - 16th World Conference on Nondestructive Testing (WCNDT 2004) T2 - 16th World Conference on Nondestructive Testing (WCNDT 2004) CY - Montreal, Canada DA - 2004-08-30 PY - 2004 AN - OPUS4-5533 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER -