TY - GEN A1 - Vladár, A. E. A1 - Hodoroaba, Vasile-Dan A2 - Hodoroaba, Vasile-Dan A2 - Unger, Wolfgang A2 - Shard, A. G. T1 - Characterization of nanoparticles by scanning electron microscopy T2 - Characterization of nanoparticles - Measurement processes for nanoparticles N2 - In this chapter sample preparation, image acquisition, and nanoparticle size and shape characterization methods using the scanning electron microscope (SEM) in reflective and transmitted working modes are described. These help in obtaining reliable, highly repeatable results. The best solutions vary case-by-case and depend on the raw (powdered or suspension) nanoparticle material, the required measurement uncertainty and on the performance of the SEM. PB - Elsevier CY - Amsterdam KW - Nanoparticles KW - Sample preparation KW - Electron microscopy KW - SEM KW - Size measurement KW - Shape KW - Threshold PY - 2020 UR - https://opus4.kobv.de/opus4-bam/frontdoor/index/index/docId/50120 AN - OPUS4-50120 SN - 978-0-12-814182-3 SP - 7 EP - 27 AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany