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Year of publication
Document Type
- Conference Proceeding (189)
- Scientific journal article peer-reviewed (173)
- Article (105)
- Scientific journal article not peer-reviewed (17)
- Part of a book (chapter) (14)
- Report (3)
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Keywords
- X-ray photoelectron spectroscopy (XPS) (20)
- atomic layer deposition (18)
- resonant photoelectron spectroscopy (16)
- atomic layer deposition (ALD) (13)
- PVDF (12)
- X-ray photoelectron spectroscopy (12)
- dielectric (10)
- TiO2 (9)
- high-k (9)
- water splitting (9)
Institute
Hoffmann, Patrick ; Mikalo, Ricardo Pablo ; Yfantis, Alexandros D. ; Batchelor, David R. ; Appel, Günter ; Schmeißer, Dieter
Metallic Single-Crystal CoSi Nanowires via Chemical Vapor Deposition of Single-Source Precursor
(2006)
Microscopic and spectroscopic characterization of interfaces and dielectric layers for OFET devices
(2009)
Müller, Klaus ; Burkov, Yevgen ; Mandal, Dipankar ; Henkel, Karsten ; Paloumpa, Ioanna ; Goryachko, Andriy ; Schmeißer, Dieter
Ultra-thin homogeneous oxynitride films are prepared on Si(001). The Si surface is cleaned in UHV by heating (flashing) and is exposed to different pressures of N2Oat altered temperatures. Thus oxynitride layers of different thickness and different properties are grown depending on the N2O pressure and the Si temperature. This isillustrated by a schematic diagram. The properties of the different oxynitride layers were studied by a combined photoemission electron microscopy (PEEM) andphotoelectron spectroscopy (PES) investigation using highly monochromatic synchrotron radiation. The amount of oxygen and nitrogen incorporated in the oxynitridelayers is determined from the PES measurements. The typical surface morphology for different preparation conditions is shown in PEEM images.