Refine
Year of publication
- 2003 (1) (remove)
Document Type
- Article (1)
Language
- English (1)
Keywords
- Annealing (1)
- Stoichiometric CuInS2-films (1)
- UPS (1)
- XPS (1)
Institute
CuInS2 films are investigated with photoelectron spectroscopy. We find significant deviation from the stoichiometric composition depending on the preparation on the films. For Cu-rich films (start composition) we show that by Ar sputtering and annealing the surface composition varies along a binary cut of the Cu-In-S ternary phase diagram. We also present a novel technique which brings the surface composition close to the stoichiometric stability range of the CuInS2 phase. The technique used the evaporation of Cu on the sputter cleaned surface.