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Author
Hecker, Michael
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Zschech, Ehrenfried
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Chumakov, Dmytro
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2010
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c60
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derivatices
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measurements
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microscope
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oxidation
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thin films
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FG Angewandte Physik und Halbleiterspektroskopie
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Local anodic oxidation by atomic force microscopy for nano-Raman strain measurements on silicon-germanium thin films
(2010)
Kolanek, Krzysztof
;
Hermann, Peter
;
Dudek, Piotr T.
;
Gotszalk, Teodor
;
Chumakov, Dmytro
;
Weisheit, Martin
;
Hecker, Michael
;
Zschech, Ehrenfried
The stability of C60 and its derivatives upon handling in microsystems technologies
(2009)
Klocek, Jolanta
;
Friedrich, Daniel
;
Schmeißer, Dieter
;
Hecker, Michael
;
Zschech, Ehrenfried
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