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Resonant inelastic soft x-ray scattering (RIXS) was used to study the electronic structure of solid
cysteine films. A RIXS map approach, i.e., plotting the x-ray emission intensity as a function of
excitation and emission energy, allows us to separate the contributions of the three chemically nonequivalent
carbon atoms in cysteine. In particular, we can identify orbitals localized near the photoexcited
atoms, as well as orbitals that are delocalized over the entire molecule.
In this paper, X-ray photoelectron and X-ray-excited
Auger electron spectroscopy was used to investigate the chemical
surface structure of CuInS2 thin-film solar cell absorbers.We find
that the [In]/[Cu] surface composition can vary between 1.6 (±0.4)
and 3.7 (±0.7), depending on relatively minor variations in the absorber
formation process and/or whether additional wet-chemical
treatments are performed. These variations are primarily due to
differences in the Cu surface concentration. The corresponding
change of the modified In Auger parameter is interpreted as being
indicative of a change in the chemical environment of In as a
function of Cu off-stoichiometry.
The surface properties of CuInS 2 (CIS) thin-fi lm solar cell absorbers are
investigated by a combination of electron and soft X-ray spectroscopies.
Spatially separated regions of varying colors are observed and identifi ed to
be dominated by either CuS or Cu 2 S surface phases. After their removal by
KCN etching, the samples cannot be distinguished by eye and the CIS surface
is found to be Cu-defi cient in both regions. However, a signifi cantly more
pronounced off-stoichiometry in the region initially covered by Cu 2 S can be
identifi ed. In this region, the resulting surface band gap is also signifi cantly
larger than the E g Surf of the initially CuS-terminated region. Such variations
may represent a hidden parameter which, if overlooked, induces irreproducibility
and thus prevents systematic optimization efforts.