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Author
Chumakov, Dmytro
(1)
Dudek, Piotr T.
(1)
Gotszalk, Teodor
(1)
Hecker, Michael
(1)
Hermann, Peter
(1)
Kolanek, Krzysztof
(1)
Weisheit, Martin
(1)
Zschech, Ehrenfried
(1)
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2010
(1)
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Scientific journal article peer-reviewed
(1)
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English
(1)
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measurements
(1)
microscope
(1)
oxidation
(1)
thin films
(1)
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FG Angewandte Physik und Halbleiterspektroskopie
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Local anodic oxidation by atomic force microscopy for nano-Raman strain measurements on silicon-germanium thin films
(2010)
Kolanek, Krzysztof
;
Hermann, Peter
;
Dudek, Piotr T.
;
Gotszalk, Teodor
;
Chumakov, Dmytro
;
Weisheit, Martin
;
Hecker, Michael
;
Zschech, Ehrenfried
1
to
1
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