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Author
Capellini, Giovanni
(3)
Chahine, Gilbert A.
(3)
Richard, Marie-Ingrid
(3)
Schülli, Tobias U.
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Zaumseil, Peter
(3)
Zöllner, Marvin Hartwig
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Häberlen, Maik
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2015
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FG Halbleitermaterialien
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an der BTU erstellt / created at BTU
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Strain and Lattice Orientation Distribution in SiN/Ge CMOS Compatible Light Emitters Microstructures by Quick X-ray Nano-diffraction Microscopy
(2015)
Chahine, Gilbert A.
;
Zöllner, Marvin Hartwig
;
Richard, Marie-Ingrid
;
Subhajit, G.
;
Zaumseil, Peter
;
Capellini, Giovanni
;
Schroeder, Thomas
;
Schülli, Tobias U.
Structural Mapping of Functional Ge Layers Grown on Graded SiGe Buffers for sub-10 nm CMOS Applications Using Advanced X-ray Nano-Diffraction
(2015)
Richard, Marie-Ingrid
;
Zöllner, Marvin Hartwig
;
Chahine, Gilbert A.
;
Zaumseil, Peter
;
Capellini, Giovanni
;
Häberlen, Maik
;
Storck, Peter
;
Schülli, Tobias U.
;
Schröder, Thomas
Imaging structure and composition homogeneity of 300 mm SiGe virtual substrates for advanced CMOS applications by scanning X-ray diffraction microscopy
(2015)
Zöllner, Marvin Hartwig
;
Richard, Marie-Ingrid
;
Chahine, Gilbert A.
;
Zaumseil, Peter
;
Reich, Christian
;
Capellini, Giovanni
;
Montalenti, Francesco
;
Marzegalli, Anna
;
Xie, Ya-Hong
;
Schülli, Tobias U.
;
Häberlen, Maik
;
Storck, Peter
;
Schroeder, Thomas
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