Combining De-Stressing and Self Repair for Long-Term Dependable Systems
Author: | Tobias Koal, Heinrich Theodor Vierhaus |
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ISBN: | 978-1-4244-6613-9 |
Title of the source (English): | 2010 IEEE 13th International Symposium on Design and Diagnostics of Electronic Circuits & Systems (DDECS 2010), Vienna, Austria, 14 - 16 April 2010 |
Publisher: | IEEE |
Place of publication: | Piscataway, NJ |
Document Type: | Conference Proceeding |
Language: | English |
Year of publication: | 2010 |
Tag: | ICs; Selbstreparatur; Test; Zuverlässigkeit |
First Page: | 99 |
Last Page: | 104 |
Comment: | IEEE Computer Society |
Faculty/Chair: | Fakultät 1 MINT - Mathematik, Informatik, Physik, Elektro- und Informationstechnik / FG Technische Informatik |
Institution name at the time of publication: | Fakultät für Mathematik, Naturwissenschaften und Informatik (eBTU) / LS Technische Informatik |