The Effects of Voltage Scaling on Reliability and Power Consumption in Multiprocessor Systems
Author: | Mitko Veleski, Rolf Kraemer, Milos Krstic |
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URL: | https://www.ihp-microelectronics.com/en/research/wireless-systems-and-applications/publications/publications-2018.html |
Title of the source (English): | Proc. 30. GI/GMM/ITG-Workshop Testmethoden und Zuverlässigkeit von Schaltungen und Systemen (TuZ 2018), 38 (2018) |
Document Type: | Conference publication peer-reviewed |
Language: | English |
Year of publication: | 2018 |
Faculty/Chair: | Fakultät 1 MINT - Mathematik, Informatik, Physik, Elektro- und Informationstechnik / FG Technische Informatik |