MetadatenAuthor: | Manfred Reiche, Martin Kittler, M. Krause, Hartmut Übensee |
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DOI: | https://doi.org/10.1063/1.4865599 |
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ISBN: | 978-0-7354-1215-6 |
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Title of the source (English): | International Conference on Defects in Semiconductors 2013, proceedings of the 27th International Conference on Defects in Semiconductors, ICDS-2013, Bologna, Italy, 21-26 July 2013 |
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Publisher: | AIP Publishing |
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Place of publication: | Melville, New York |
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Editor: | Anna Cavallini, Stefan K. Estreicher |
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Document Type: | Conference Proceeding |
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Language: | English |
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Year of publication: | 2014 |
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Contributing Corporation: | MPI Halle, IHP, CIS Erfurt |
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Series ; volume number: | AIP conference proceedings ; 1583,1 |
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Article number: | 33 |
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Faculty/Chair: | Fakultät 1 MINT - Mathematik, Informatik, Physik, Elektro- und Informationstechnik / FG Schaltkreisentwurf |
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Institution name at the time of publication: | Fakultät für Mathematik, Naturwissenschaften und Informatik (eBTU) / LS Schaltkreisentwurf |
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