VTE - A new Method for Characterisation of Thin Film Properties
Author: | Olaf Kahle, C. Uhlig, Monika BauerGND |
---|---|
ISBN: | 0-7803-7220-4 |
Title of the source (English): | Proceedings presented at POLYTRONIC 2001, Potsdam, Germany, October 21 - 24, 2001 |
Publisher: | IEEE Service Center |
Place of publication: | Piscataway, NJ |
Document Type: | Conference Proceeding |
Language: | English |
Year of publication: | 2001 |
Faculty/Chair: | Fakultät 2 Umwelt und Naturwissenschaften / FG Polymermaterialien |
Institution name at the time of publication: | Fakultät für Mathematik, Naturwissenschaften und Informatik (eBTU) / LS Polymermaterialien |