Depth Profiling of the Recombination Activity of Defects Measured by Temperature-dependent Cross-sectional EBIC
Author: | Oleg F. Vyvenko, O. Krüger, Martin Kittler |
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Document Type: | Article |
Language: | English |
Year of publication: | 2001 |
Quelle aus UBICO: | Solid State Phenomena 78-79, 65 |
Faculty/Chair: | Fakultät 1 MINT - Mathematik, Informatik, Physik, Elektro- und Informationstechnik / FG Systeme |
Institution name at the time of publication: | Fakultät für Mathematik, Naturwissenschaften und Informatik (eBTU) / LS Systeme |