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The morphology of VO2/TiO2(001): terraces, facets, and cracks

  • Vanadium dioxide (VO2) features a pronounced, thermally-driven metal-to-insulator transition at 340 K. Employing epitaxial stress on rutile TiO2(001) substrates, the transition can be tuned to occur close to room temperature. Striving for applications in oxide-electronic devices, the lateral homogeneity of such samples must be considered as an important prerequisite for efforts towards miniaturization. Moreover, the preparation of smooth surfaces is crucial for vertically stacked devices and, hence, the design of functional interfaces. Here, the surface morphology of VO2/TiO2(001) films was analyzed by low-energy electron microscopy and diffraction as well as scanning probe microscopy. The formation of large terraces could be achieved under temperature-induced annealing, but also the occurrence of facets was observed and characterized. Further, we report on quasi-periodic arrangements of crack defects which evolve due to thermal stress under cooling. While these might impair some applicational endeavours, they may also presentVanadium dioxide (VO2) features a pronounced, thermally-driven metal-to-insulator transition at 340 K. Employing epitaxial stress on rutile TiO2(001) substrates, the transition can be tuned to occur close to room temperature. Striving for applications in oxide-electronic devices, the lateral homogeneity of such samples must be considered as an important prerequisite for efforts towards miniaturization. Moreover, the preparation of smooth surfaces is crucial for vertically stacked devices and, hence, the design of functional interfaces. Here, the surface morphology of VO2/TiO2(001) films was analyzed by low-energy electron microscopy and diffraction as well as scanning probe microscopy. The formation of large terraces could be achieved under temperature-induced annealing, but also the occurrence of facets was observed and characterized. Further, we report on quasi-periodic arrangements of crack defects which evolve due to thermal stress under cooling. While these might impair some applicational endeavours, they may also present crystallographically well-oriented nano-templates of bulk-like properties for advanced approaches.show moreshow less

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Author: Jon-Olaf KrisponeitORCiD, Simon FischerORCiD, Sven Esser, Vasily Moshnyaga, Thomas SchmidtORCiD, Louis F. J. PiperORCiD, Jan Ingo FlegeORCiD, Jens FaltaORCiD
DOI:https://doi.org/10.1038/s41598-020-78584-9
ISSN:2045-2322
Title of the source (English):Scientific Reports
Document Type:Scientific journal article peer-reviewed
Language:English
Year of publication:2020
Tag:Vanadium dioxide (VO2); crystallography; low-energy electron diffraction (LEED); low-energy electron microscopy (LEEM); metal-to-insulator transition; morphology; rutile TiO2(001); scanning probe microscopy
Volume/Year:10
Number of pages:8
Article number:22374
Faculty/Chair:Fakultät 1 MINT - Mathematik, Informatik, Physik, Elektro- und Informationstechnik / FG Angewandte Physik und Halbleiterspektroskopie
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