X-ray Characterization of Ge Dots Epitaxially Grown on Nano-structured Si Islands on SOI Substrates
Author: | Peter Zaumseil, Grzegorz Kozłowski, Yuji Yamamoto, Markus Andreas Schubert, Thomas Schroeder |
---|---|
ISSN: | 0021-8898 |
Title of the source (English): | Journal of Applied Crystallography |
Document Type: | Scientific journal article peer-reviewed |
Language: | English |
Year of publication: | 2013 |
Volume/Year: | 46 |
Issue number: | 4 |
First Page: | 868 |
Last Page: | 873 |
Faculty/Chair: | Fakultät 1 MINT - Mathematik, Informatik, Physik, Elektro- und Informationstechnik / FG Halbleitermaterialien |
Institution name at the time of publication: | Fakultät für Mathematik, Naturwissenschaften und Informatik (eBTU) / LS Halbleitermaterialien |