A Configurable Modular Test Processor and Scan Controller Architecture
Author: | Raik Frost, D. Rudolph, Christian Galke, René Kothe, Heinrich Theodor Vierhaus |
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ISBN: | 0-7695-2918-6 |
Title of the source (English): | Proceedings, IOLTS 2007, 13th IEEE International On-Line Testing Symposium, Heraklion, Crete, Greece, 8 - 11 July 2007 |
Publisher: | IEEE |
Place of publication: | Piscataway, NJ |
Document Type: | Conference Proceeding |
Language: | English |
Year of publication: | 2007 |
Tag: | ICs; Selbsttest; SoCs; Test |
First Page: | 277 |
Last Page: | 284 |
Comment: | IEEE Computer Society |
Faculty/Chair: | Fakultät 1 MINT - Mathematik, Informatik, Physik, Elektro- und Informationstechnik / FG Technische Informatik |
Institution name at the time of publication: | Fakultät für Mathematik, Naturwissenschaften und Informatik (eBTU) / LS Technische Informatik |