Femtosecond nonlinear optical characterisation of silicon wafers: the role of symmetry
Author: | Jürgen ReifGND, Thomas Schneider, Dirk Wolfframm, Reiner P. Schmid |
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URL: | http://www.sciencedirect.com/science/article/pii/S1369800100001669 |
DOI: | https://doi.org/10.1016/S1369-8001(00)00166-9 |
ISSN: | 1369-8001 |
Title of the source (English): | Materials Science in Semiconductor Processing |
Document Type: | Scientific journal article peer-reviewed |
Language: | English |
Year of publication: | 2001 |
Volume/Year: | 4 |
Issue number: | 1-3 |
First Page: | 241 |
Last Page: | 243 |
Faculty/Chair: | Fakultät 2 Umwelt und Naturwissenschaften / AG Physikalische Chemie II |
Institution name at the time of publication: | Fakultät für Mathematik, Naturwissenschaften und Informatik (eBTU) / LS Physikalische Chemie und Analytik (ehemals) |