The role of gate leakage on surface-related current collapse in AlGaN/GaN HEMTs
Author: | Christos Zervos, Petros Beleniotis, Sascha Krause, Dan Ritter, Matthias Rudolph |
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DOI: | https://doi.org/10.23919/EuMIC58042.2023.10289036 |
ISBN: | 978-2-87487-073-6 |
ISBN: | 979-8-3503-4833-0 |
Title of the source (English): | 18th European Microwave Integrated Circuits Conference (EuMIC), 18-19 September 2023, Berlin |
Document Type: | Conference publication peer-reviewed |
Language: | English |
Year of publication: | 2023 |
Volume/Year: | 2023 |
First Page: | 297 |
Last Page: | 300 |
Way of publication: | Open Access |
Faculty/Chair: | Fakultät 1 MINT - Mathematik, Informatik, Physik, Elektro- und Informationstechnik / Stiftungsprofessur Hochfrequenz- und Mikrowellentechnik |