Comparison of the SET Sensitivity of Standard Logic Gates Designed in 130 nm CMOS Technology
Author: | Marko AndjelkovicGND, Milos Krstic, Rolf Kraemer |
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DOI: | https://doi.org/10.1109/MIEL.2017.8190106 |
ISBN: | 978-1-5386-2563-7 |
ISBN: | 978-1-5386-2561-3 |
Title of the source (English): | 30th International Conference on Microelectronics (MIEL), 9-11 Oct. 2017, Nis, Serbia |
Publisher: | IEEE |
Place of publication: | Piscataway, NJ |
Document Type: | Conference Proceeding |
Language: | English |
Year of publication: | 2017 |
First Page: | 217 |
Last Page: | 220 |
Faculty/Chair: | Fakultät 1 MINT - Mathematik, Informatik, Physik, Elektro- und Informationstechnik / FG Systeme |