2D TCAD Simulation of Single Event Transients in 250 nm Bulk CMOS Technology
Author: | Marko AndjelkovicGND, Ulrich Jagdhold, Milos Krstic, Rolf Kraemer |
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ISBN: | 978-3-8007-4444-2 |
Title of the source (German): | Zuverlässigkeit und Entwurf, 9. ITG/GMM/GI-Fachtagung vom 18.-20. September 2017 in Cottbus |
Publisher: | Berlin |
Place of publication: | VDE Verlag |
Document Type: | Conference Proceeding |
Language: | English |
Year of publication: | 2017 |
First Page: | 90 |
Last Page: | 96 |
Series ; volume number: | ITG-Fachbericht ; 274 |
Faculty/Chair: | Fakultät 1 MINT - Mathematik, Informatik, Physik, Elektro- und Informationstechnik / FG Systeme |