MetadatenAuthor: | Dieter SchmeißerORCiD, Matthias RichterGND, Massimo TallaridaORCiD |
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DOI: | https://doi.org/10.1002/9783527667703.ch45 |
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ISBN: | 978-3-527-41191-7 |
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Title of the source (English): | Frontiers in Electronic Materials: A Collection of Extended Abstracts of the Nature Conference Frontiers in Electronic Materials, June 17 to 20 2012, Aachen, Germany |
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Publisher: | Wiley-VCH |
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Place of publication: | Weinheim |
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Editor: | Jörg Heber, Darrell Schlom, Yoshinori Tokura, Rainer Waser, Matthias Wuttig |
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Document Type: | Conference Proceeding |
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Language: | English |
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Year of publication: | 2012 |
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Tag: | Auger processes; X-ray absorption spectroscopy; XPS; resonant photoelectron spectroscopy |
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First Page: | 255 |
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Last Page: | 256 |
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Faculty/Chair: | Fakultät 1 MINT - Mathematik, Informatik, Physik, Elektro- und Informationstechnik / FG Angewandte Physik und Halbleiterspektroskopie |
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Institution name at the time of publication: | Fakultät für Mathematik, Naturwissenschaften und Informatik (eBTU) / LS Angewandte Physik / Sensorik |
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