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Interlayer-exciton mediated three-hole-Auger-decay in the pi-band of highly oriented pyrolytic graphite

  • Resonant photoemission spectroscopy(resPES) is used to probe the occupied pi- and unoccupied pi*-bands of carbon thin films with particular focus on the Auger decay. Highly Oriented Pyrolytic Graphite (HOPG) is studied at the C1s edge. We find strong resonant features at 285.5 eV and 292 eV in the resPES diagram. The normal two-hole Auger decay proceeds under constant kinetic energy (451)only in the sigma*-region. In the pi*-region, however, it proceeds under 67.5° in terms of a Ebind(w) diagram. We attribute this to a multiple Auger decay with a net three hole final state. For this novel decay process we propose a model.We discuss the long lifetime of the first resonant excitation and conclude that it arises from the strong excitonic character of the first resonant state. We use HOPG as a reference system and suggest that this novel process is a tool to identify interlayer–substrate interaction of the carbon layers involved.

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Metadaten
Author: Matthias RichterGND, Daniel Friedrich, Dieter SchmeißerORCiD
DOI:https://doi.org/10.1016/j.physe.2013.01.015
ISSN:1386-9477
Title of the source (English):Physica E
Document Type:Scientific journal article peer-reviewed
Language:English
Year of publication:2014
Tag:HOPG; X-ray photoelectron spectroscopy; resonant excitation; three hole Auger decay
Volume/Year:Vol. 56
First Page:441
Last Page:446
Faculty/Chair:Fakultät 1 MINT - Mathematik, Informatik, Physik, Elektro- und Informationstechnik / FG Angewandte Physik und Halbleiterspektroskopie
Institution name at the time of publication:Fakultät für Mathematik, Naturwissenschaften und Informatik (eBTU) / LS Angewandte Physik / Sensorik
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