On the Feasibility of Combining On-Line-Test and Self Repair for Logic Circuits
Author: | Tobias Koal, Markus Ulbricht, Piet Engelke, Heinrich Theodor Vierhaus |
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ISBN: | 978-1-4673-6135-4 |
Title of the source (English): | 16th IEEE Symposium on Design and Diagnostics of Electronic Circuits and Systems (DDECS 2013), Karlovny Vary, April 2013 |
Publisher: | IEEE Computer Society |
Editor: | Lukas Sekanina |
Document Type: | Conference Proceeding |
Language: | English |
Year of publication: | 2013 |
Faculty/Chair: | Fakultät 1 MINT - Mathematik, Informatik, Physik, Elektro- und Informationstechnik / FG Technische Informatik |
Institution name at the time of publication: | Fakultät für Mathematik, Naturwissenschaften und Informatik (eBTU) / LS Technische Informatik |