Fine-Grained Software-Based Self Repair of VLIW Processors
Author: | Mario Schölzel |
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ISBN: | 978-1-4577-1713-0 |
Title of the source (English): | 2011 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT 2011), Vancouver, British Columbia, Canada, 3 - 5 October 2011 |
Publisher: | IEEE |
Place of publication: | Piscataway, NJ |
Document Type: | Conference Proceeding |
Language: | English |
Year of publication: | 2011 |
Tag: | Prozessoren; Selbstreparatur; Test; Zuverlässigkeit |
First Page: | 41 |
Last Page: | 49 |
Comment: | IEEE Computer Society |
Faculty/Chair: | Fakultät 1 MINT - Mathematik, Informatik, Physik, Elektro- und Informationstechnik / FG Technische Informatik |
Institution name at the time of publication: | Fakultät für Mathematik, Naturwissenschaften und Informatik (eBTU) / LS Technische Informatik |