HW / SW Co-Detection of Transient and Permanent Faults with Fast Recovery in Statically Scheduled Data Paths
Author: | Mario Schölzel |
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ISBN: | 978-1-4244-7054-9 |
Title of the source (English): | 2010 Design, Automation & Test in Europe Conference & Exhibition, DATE 2010, Dresden, Germany, 8 - 12 March 2010 |
Publisher: | IEEE |
Place of publication: | Piscataway, NJ |
Document Type: | Conference Proceeding |
Language: | English |
Year of publication: | 2010 |
First Page: | 723 |
Last Page: | 728 |
Faculty/Chair: | Fakultät 1 MINT - Mathematik, Informatik, Physik, Elektro- und Informationstechnik / FG Technische Informatik |
Institution name at the time of publication: | Fakultät für Mathematik, Naturwissenschaften und Informatik (eBTU) / LS Technische Informatik |