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Atomic Layer-Deposited Aluminum Oxide Hinders Iodide Migration and Stabilizes Perovskite Solar Cells

  • Iodide migration causes degradation of the perovskite solar cells. Here,we observe the direct migration of iodide into the hole-transport layer in a device. We demonstrate that ultrathin room temperature atomic layer-deposited Al2O3 on the perovskite surface very effectively hinders the migration. The perovskite-Al2O3 interface enables charge transfer across the Al2O3 layer in the solar cells, without causing any drastic changes in the properties of the perovskite absorber. Furthermore, it helps to preserve the initial properties of the perovskite film during exposure to light and air under real operating conditions, and thus, improves the stability of the solar cells. The ultrathin Al2O3 layer deposited at room temperature significantly increases the lifetime of the perovskite solar cells, and we hope this may be a step toward the mass production of stable devices.

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Author: Chittaranjan DasORCiD, Małgorzata KotORCiD, Tim HellmannORCiD, Carolin Wittich, Eric Mankel, Iwan Zimmermann, Dieter SchmeißerORCiD, Mohammad Khaja Nazeeruddin, Wolfram Jaegermann
DOI:https://doi.org/10.1016/j.xcrp.2020.100112
ISSN:2666-3864
Title of the source (English):Cell Reports Physical Science
Document Type:Scientific journal article peer-reviewed
Language:English
Year of publication:2020
Tag:X-ray photoelectron spectroscopy (XPS); aluminum oxide (Al2O3); atomic layer deposition (ALD); iodine migration; perovskite solar cells; stability
Volume/Year:1
Issue number:7
Number of pages:18
Article number:100112
Faculty/Chair:Fakultät 1 MINT - Mathematik, Informatik, Physik, Elektro- und Informationstechnik / FG Angewandte Physik und Halbleiterspektroskopie
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