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The effect of X-ray photoelectron spectroscopy measurement on P(VDF-TrFE) copolymer thin films

  • The impact of prolonged X-ray irradiation during X-ray photoelectron spectroscopy (XPS) measurement was investigated on poly(vinylidene-trifluoroethylene) (P(VDF-TrFE)) thin films. It was observed that prolonged X-ray irradiation can accelerate the crosslinking of P(VDF-TrFE) and diminish the ferroelectric phase. Fourier transform infrared spectroscopy (FT-IR) data indicate that the ferroelectric phase diminishes completely after 360 kJ of X-ray irradiation dose and it induces the paraelectric phase. In this work, the main emphasis was given to the optimization of the X-ray irradiation dose during XPS measurements to maintain the ferroelectric phase within the copolymer films.

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Author: Dipankar MandalORCiDGND, Klaus Müller, Karsten HenkelORCiDGND, Dieter SchmeißerORCiD
DOI:https://doi.org/10.1016/j.apsusc.2012.07.144
ISSN:0169-4332
ISSN:1873-5584
Title of the source (English):Applied Surface Science
Document Type:Scientific journal article peer-reviewed
Language:English
Year of publication:2012
Tag:Ferroelectric to paraelectric phase transformation; P(VDF-TrFE) copolymer thin film; X-ray irradiation; XPS measurement
Issue number:261
First Page:209
Last Page:213
Faculty/Chair:Fakultät 1 MINT - Mathematik, Informatik, Physik, Elektro- und Informationstechnik / FG Angewandte Physik und Halbleiterspektroskopie
Institution name at the time of publication:Fakultät für Mathematik, Naturwissenschaften und Informatik (eBTU) / LS Angewandte Physik / Sensorik
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