The effect of X-ray photoelectron spectroscopy measurement on P(VDF-TrFE) copolymer thin films
- The impact of prolonged X-ray irradiation during X-ray photoelectron spectroscopy (XPS) measurement was investigated on poly(vinylidene-trifluoroethylene) (P(VDF-TrFE)) thin films. It was observed that prolonged X-ray irradiation can accelerate the crosslinking of P(VDF-TrFE) and diminish the ferroelectric phase. Fourier transform infrared spectroscopy (FT-IR) data indicate that the ferroelectric phase diminishes completely after 360 kJ of X-ray irradiation dose and it induces the paraelectric phase. In this work, the main emphasis was given to the optimization of the X-ray irradiation dose during XPS measurements to maintain the ferroelectric phase within the copolymer films.
Author: | Dipankar MandalORCiDGND, Klaus Müller, Karsten HenkelORCiDGND, Dieter SchmeißerORCiD |
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DOI: | https://doi.org/10.1016/j.apsusc.2012.07.144 |
ISSN: | 0169-4332 |
ISSN: | 1873-5584 |
Title of the source (English): | Applied Surface Science |
Document Type: | Scientific journal article peer-reviewed |
Language: | English |
Year of publication: | 2012 |
Tag: | Ferroelectric to paraelectric phase transformation; P(VDF-TrFE) copolymer thin film; X-ray irradiation; XPS measurement |
Issue number: | 261 |
First Page: | 209 |
Last Page: | 213 |
Faculty/Chair: | Fakultät 1 MINT - Mathematik, Informatik, Physik, Elektro- und Informationstechnik / FG Angewandte Physik und Halbleiterspektroskopie |
Institution name at the time of publication: | Fakultät für Mathematik, Naturwissenschaften und Informatik (eBTU) / LS Angewandte Physik / Sensorik |