Reliable GaN HEMT Modeling Based on Chalmers Model and Pulsed S-Parameter Measurements
Author: | Peng Luo, Olof Bengtsson, Matthias Rudolph |
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DOI: | https://doi.org/10.1109/GEMIC.2016.7461650 |
ISBN: | 978-3-9812668-7-0 |
Title of the source (English): | 2016 German Microwave Conference, March 14-16, 2016 Bochum, Germany |
Publisher: | IEEE |
Place of publication: | Piscataway, NJ |
Document Type: | Conference Proceeding |
Language: | English |
Year of publication: | 2016 |
First Page: | 441 |
Last Page: | 444 |
Faculty/Chair: | Fakultät 1 MINT - Mathematik, Informatik, Physik, Elektro- und Informationstechnik / Stiftungsprofessur Hochfrequenz- und Mikrowellentechnik |