MetadatenAuthor: | Frank Steinhäußer, Armin Talai, Gabriela Sandulache, Robert Weigel, Alexander Kölpin, Wolfgang Hansal, Achim Bittner, Ulrich Schmid |
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DOI: | https://doi.org/10.1016/j.microrel.2016.02.010 |
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ISSN: | 0026-2714 |
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Title of the source (English): | Microelectronics Reliability |
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Document Type: | Scientific journal article peer-reviewed |
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Language: | English |
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Year of publication: | 2016 |
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Volume/Year: | 60 |
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First Page: | 93 |
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Last Page: | 100 |
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Faculty/Chair: | Fakultät 1 MINT - Mathematik, Informatik, Physik, Elektro- und Informationstechnik / FG Elektronische Systeme und Sensorik |
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