A Resonant Substrate Integrated Waveguide Measurement System for True Relative Permittivity Extraction of PCB Materials up to 90 GHz
Author: | Isabella Lau, Fabian Michler, Armin Talai, Robert Weigel, Alexander Kölpin |
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DOI: | https://doi.org/10.1109/IMWS-AMP.2018.8457133 |
ISBN: | 978-1-5386-5569-6 |
Title of the source (English): | 2018 IEEE MTT-S International Microwave Workshop Series on Advanced Materials and Processes for RF and THz Applications (IMWS-AMP) : 16-18 July 2018 |
Publisher: | IEEE |
Place of publication: | Piscataway, NJ |
Document Type: | Conference Proceeding |
Language: | English |
Year of publication: | 2018 |
Number of pages: | 3 |
Faculty/Chair: | Fakultät 1 MINT - Mathematik, Informatik, Physik, Elektro- und Informationstechnik / FG Elektronische Systeme und Sensorik |