An experimental extracted model for latchup analysis in CMOS process
Author: | Dirk Killat, Ye Li, Xiaohan Gong, Weiwei Xu, Zhiliang Hong |
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ISBN: | 978-1-4244-3868-6 |
Title of the source (English): | IEEE 8th International Conference on ASIC, 2009, ASICON '09, 20 - 23 Oct. 2009, Changsha, China, proceedings |
Publisher: | IEEE |
Place of publication: | Piscataway, NJ |
Document Type: | Conference Proceeding |
Language: | English |
Year of publication: | 2009 |
First Page: | 1035 |
Last Page: | 1038 |
Faculty/Chair: | Fakultät 1 MINT - Mathematik, Informatik, Physik, Elektro- und Informationstechnik / FG Mikroelektronik |
Institution name at the time of publication: | Fakultät für Maschinenbau, Elektrotechnik und Wirtschaftsingenieurwesen (eBTU) / LS Mikroelektronik |