A streamlined drain-lag model for GaN HEMTs based on pulsed S-parameter measurements
Author: | Peng Luo, Frank Schnieder, Olof Bengtsson, Valeria Vadalà, Antonio Raffo, Wolfgang Heinrich, Matthias Rudolph |
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DOI: | https://doi.org/10.1017/S1759078719000060 |
ISSN: | 1759-0787 |
ISSN: | 1759-0795 |
Title of the source (English): | International Journal of Microwave and Wireless Technologies |
Document Type: | Scientific journal article peer-reviewed |
Language: | English |
Year of publication: | 2019 |
Volume/Year: | 11 |
Issue number: | 2 |
First Page: | 121 |
Last Page: | 129 |
Faculty/Chair: | Fakultät 1 MINT - Mathematik, Informatik, Physik, Elektro- und Informationstechnik / Stiftungsprofessur Hochfrequenz- und Mikrowellentechnik |