Localization of Trapping Effects in GaN HEMTs with Pulsed S-parameters and Compact Models
Author: | Petros Beleniotis, Frank Schnieder, Serguei A. Chevtchenko, Matthias Rudolph |
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DOI: | https://doi.org/10.23919/EuMIC54520.2022.9923511 |
ISBN: | 978-2-87487-070-5 |
ISBN: | 978-1-6654-5880-1 |
Title of the source (German): | 17th European Microwave Integrated Circuits Conference (EuMIC) |
Document Type: | Conference publication peer-reviewed |
Language: | German |
Year of publication: | 2022 |
First Page: | 149 |
Last Page: | 152 |
Way of publication: | Open Access |
Faculty/Chair: | Fakultät 1 MINT - Mathematik, Informatik, Physik, Elektro- und Informationstechnik / Stiftungsprofessur Hochfrequenz- und Mikrowellentechnik |