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Growth and structure of singly oriented single-layer tungsten disulfide on Au(111)

  • A singly oriented, single layer of tungsten disulfide (WS2) was epitaxially grown on Au(111) and characterized at the nanoscale by combining photoelectron spectroscopy, photoelectron diffraction, and low-energy electron microscopy. Fast x-ray photoelectron spectroscopy revealed that the growth of a single crystalline orientation is triggered by choosing a low W evaporation rate and performing the process with a high temperature of the substrate. Information about the single orientation of the layer was obtained by acquiring x-ray photoelectron diffraction patterns, revealing a 1H polytype for the WS2 layer and, moreover, determining the structural parameters and registry with the substrate. The distribution, size, and orientation of the WS2 layer were further ascertained by low-energy electron microscopy.

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Author: Luca Bignardi, Daniel LizzitORCiD, Harsh BanaORCiD, Elisabetta Travaglia, Paolo Lacovig, Charlotte E. SandersORCiD, Maciej DendzikORCiD, Matteo Michiardi, Marco Bianchi, Moritz EwertORCiD, Lars BußORCiD, Jens FaltaORCiD, Jan Ingo FlegeORCiD, Alessandro BaraldiORCiD, Rosanna LarcipreteORCiD, Philip HofmannORCiD, Silvano LizzitORCiD
DOI:https://doi.org/10.1103/PhysRevMaterials.3.014003
ISSN:2475-9953
Title of the source (English):Physical Review Materials
Document Type:Scientific journal article peer-reviewed
Language:English
Year of publication:2019
Tag:Au (111); low-energy electron microscopy; photoelectron diffraction; photoelectron spectroscopy; tungsten disulfide (WS2)
Volume/Year:3
Issue number:1
Number of pages:8
Article number:014003
Faculty/Chair:Fakultät 1 MINT - Mathematik, Informatik, Physik, Elektro- und Informationstechnik / FG Angewandte Physik und Halbleiterspektroskopie
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